Item Name | Test Set Semiconduc |
Federal Supply Group (FSG) | Instruments and Laboratory Equipment |
Federal Supply Class (FSC) | 6625 Electrical and Electronic Properties Measuring and Testing Instruments |
National Item Identification Number (NIIN) | 00-504-1949 (005041949) |
NCB Code | USA (00) |
Manufacturer | Edo Corp |
MRC | Criteria | Characteristic |
---|---|---|
HGTH | HEIGHT | 3.000 INCHES NOMINAL |
ANNQ | MATERIAL AND LOCATION | ALUMINUM CARRYING CASE |
ACYR | DC VOLTAGE RATING | 1.5 VOLTS NOMINAL |
AQXY | TEST TYPE FOR WHICH DESIGNED | TO MEASURE THE RELATIVE NOISE FIGURE OF MICROWAVE MIXER CRYSTALS,TO OBTAIN AN APPROXIMATE IMPEDANCE CHECK FOR SELECTING MATCHED CRYSTALS,FOR USE IN BALANCE MIXERS,TO MEASURE THE RELATIVE SENSITIVITY OF MICROWAVE DETECTOR CRYSTALS |
ABGL | WIDTH | 6.000 INCHES NOMINAL |
ABRY | LENGTH | 6.000 INCHES NOMINAL |
ANPZ | INCLOSURE FEATURE | SINGLE ITEM W/CARRYING CASE |
FEAT | SPECIAL FEATURES | ACCEPTS CERAMIC CARTRIDGE AND COAXIAL TYPES OF BOTH NORMAL AND REVERSED POLARITIES; REMOTE TEST JACK PERMITS TESTING CRYSTALS W/O REMOVING THEM FROM RECEIVER |
ALSF | INTERNAL BATTERY ACCOMMODATION | INCLUDED |
AQXZ | OPERATING TEST CAPABILITY | SILICON MIXER CRYSTALS,RANGE 0 TO 10000 MC,PORM 1/2 DB ON CONVERSION LOSS,PORM 0.5 DB ON NOISE TEMP |
Components Related to NSN - 6625-00-504-1949, 6625005041949 | ||||
6625-01-013-9900 (6625010139900) | 6680-01-220-8387 (6680012208387) | 6625-00-214-4013 (6625002144013) | 6625-00-179-5205 (6625001795205) | |
6650-01-248-7633 (6650012487633) | 6625-01-501-9034 (6625015019034) | 6645-00-894-6161 (6645008946161) | 6625-01-049-3512 (6625010493512) | |
6625-01-145-2851 (6625011452851) | 6685-00-834-4280 (6685008344280) | 6665-00-526-5334 (6665005265334) | 6640-01-585-1236 (6640015851236) | |
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