| Item Name | Microcircuit Memory |
| Federal Supply Group (FSG) | Electrical and Electronic Equipment Components |
| Federal Supply Class (FSC) | 5962 Microcircuits Electronic |
| National Item Identification Number (NIIN) | 01-373-9121 (013739121) |
| NCB Code | USA (01) |
| Manufacturer | Dla Land And Maritime, Raytheon Company, Military Specifications |
| Part Number | Manufacturer | Item Name | Cage Code | RFQ |
|---|---|---|---|---|
| 8200801JA | dla land and maritime | microcircuit memory | 67268 | RFQ |
| G395748-9 | raytheon company | microcircuit memory | 54x10 | RFQ |
| M38510/21101BJA | military specifications | microcircuit memory | 81349 | RFQ |
| PRG395748-9 | raytheon company | microcircuit memory | 3b150 | RFQ |
| MRC | Criteria | Characteristic |
|---|---|---|
| AEHX | MAXIMUM POWER DISSIPATION RATING | 1.04 WATTS |
| CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
| CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | D-3 MIL-M-38510 |
| CTQX | CURRENT RATING PER CHARACTERISTIC | 100.00 MILLIAMPERES MAXIMUM OUTPUT SINK |
| CZEQ | TIME RATING PER CHACTERISTIC | 95.00 NANOSECONDS NOMINAL ACCESS |
| CZES | HYBRID TECHNOLOGY TYPE | MONOLITHIC |
| AGAV | END ITEM IDENTIFICATION | SUB HPA E/I FSCM 49956 |
| CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
| TEST | TEST DATA DOCUMENT | 81349-MIL-M-38510 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS,BROCHURES,ETC.,THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS,INDUSTRY DIRECTORIES,AND SIMILAR TRADE PUBLICATIONS,REFLECTI |
| ZZZK | SPECIFICATION/STANDARD DATA | 67268-8200801JA GOVERNMENT STANDARD |
| ZZZP | PURCHASE DESCRIPTION IDENTIFICATION | 49956-G395748-9 |
| AFGA | OPERATING TEMP RANGE | -55.0 TO 125.0 DEG CELSIUS |
| CQSJ | INCLOSURE MATERIAL | CERAMIC |
| CXCY | PART NAME ASSIGNED BY CONTROLLING AGENCY | MICROCIRCUIT,MEMORY,DIGITAL,SCHOTTKY BIPOLAR 32K PROM,MONOLITHIC SILICON |
| CZER | MEMORY DEVICE TYPE | PROM |
| TTQY | TERMINAL TYPE AND QUANTITY | 24 PRINTED CIRCUIT |
| ZZZX | DEPARTURE FROM CITED DESIGNATOR | ALTERED BY PROGRAMMING & TESTING |
| AFJQ | STORAGE TEMP RANGE | -65.0 TO 150.0 DEG CELSIUS |
| CBBL | FEATURES PROVIDED | BIPOLAR AND MONOLITHIC AND PROGRAMMED AND SCHOTTKY |
| CQWX | OUTPUT LOGIC FORM | BIPOLAR METAL-OXIDE SEMICONDUCTOR |
| CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | -0.3 VOLTS MINIMUM APPLIED AND 7.0 VOLTS MAXIMUM APPLIED |
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