Item Name | Microcircuit Memory |
Federal Supply Group (FSG) | Electrical and Electronic Equipment Components |
Federal Supply Class (FSC) | 5962 Microcircuits Electronic |
National Item Identification Number (NIIN) | 01-148-9247 (011489247) |
NCB Code | USA (01) |
Manufacturer | Msis Semiconductor Inc, Advanced Micro Devices Inc, Lockheed Martin Corporation, Ideal Precision Meter Co, Mitel Semiconductor Inc, Now Electronics Inc |
Part Number | Manufacturer | Item Name | Cage Code | RFQ |
---|---|---|---|---|
AM2812ADLB | msis semiconductor inc | microcircuit memory | 0hw02 | RFQ |
AM2812ADLB | advanced micro devices inc | microcircuit memory | 34335 | RFQ |
AM2812DMB | advanced micro devices inc | microcircuit memory | 34335 | RFQ |
C4918-1 | lockheed martin corporation | microcircuit memory | 81755 | RFQ |
ISI2812ADLB | ideal precision meter co | microcircuit memory | 0hr61 | RFQ |
MJ2812M 883B | mitel semiconductor inc | microcircuit memory | 53469 | RFQ |
NW2812ADLB | now electronics inc | microcircuit memory | 4t888 | RFQ |
MRC | Criteria | Characteristic |
---|---|---|
ADAQ | BODY LENGTH | 1.380 INCHES MINIMUM AND 1.420 INCHES MAXIMUM |
ADAT | BODY WIDTH | 0.560 INCHES MINIMUM AND 0.600 INCHES MAXIMUM |
ADAU | BODY HEIGHT | 0.080 INCHES MINIMUM AND 0.140 INCHES MAXIMUM |
AFGA | OPERATING TEMP RANGE | -55.0 TO 85.0 DEG CELSIUS |
AFJQ | STORAGE TEMP RANGE | -65.0 TO 150.0 DEG CELSIUS |
AGAV | END ITEM IDENTIFICATION | 5865-01-109-1686 CONTROLLER,DATA |
CBBL | FEATURES PROVIDED | HERMETICALLY SEALED AND MONOLITHIC AND 3-STATE OUTPUT |
CQSJ | INCLOSURE MATERIAL | CERAMIC AND GLASS |
CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
CQWX | OUTPUT LOGIC FORM | P-TYPE METAL OXIDE-SEMICONDUCTOR LOGIC |
CQZP | INPUT CIRCUIT PATTERN | 14 INPUT |
CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | -10.0 VOLTS MAXIMUM POWER SOURCE |
CZEQ | TIME RATING PER CHACTERISTIC | 500.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,LOW TO HIGH LEVEL OUTPUT AND 500.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,HIGH TO LOW LEVEL OUTPUT |
CZER | MEMORY DEVICE TYPE | FIRST-IN FIRST-OUT |
TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS,INDIVIDUAL MANUFACTUREER STANDARDS,ETC.). |
TTQY | TERMINAL TYPE AND QUANTITY | 28 PRINTED CIRCUIT |
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