HERMETICALLY SEALED AND MONOLITHIC AND LOW POWER AND W/ENABLE
CQSJ
INCLOSURE MATERIAL
CERAMIC
CQSZ
INCLOSURE CONFIGURATION
DUAL-IN-LINE
CQWX
OUTPUT LOGIC FORM
COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC
CQZP
INPUT CIRCUIT PATTERN
DUAL 3 INPUT
CSSL
DESIGN FUNCTION AND QUANTITY
2 DECODER,BINARY TO ONE OF FOUR
CTFT
CASE OUTLINE SOURCE AND DESIGNATOR
D-2 MIL-M-38510
CTQX
CURRENT RATING PER CHARACTERISTIC
100.00 MICROAMPERES MAXIMUM SUPPLY
CWSG
TERMINAL SURFACE TREATMENT
SOLDER
CZEN
VOLTAGE RATING AND TYPE PER CHARACTERISTIC
20.0 VOLTS MAXIMUM TOTAL SUPPLY
CZEQ
TIME RATING PER CHACTERISTIC
400.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,LOW TO HIGH LEVEL OUTPUT AND 400.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,HIGH TO LOW LEVEL OUTPUT
TEST
TEST DATA DOCUMENT
14933-77047 DRAWING (THIS IS THE BASIC GOVERNING DRAWING,SUCH AS A CONTRACTOR DRAWING,ORIGINAL EQUIPMENT MANUFACTURER DRAWING,ETC.; EXCLUDES ANY SPECIFICATION,STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRAWIN
TTQY
TERMINAL TYPE AND QUANTITY
16 PRINTED CIRCUIT
Components Related to NSN - 5962-01-102-4232, 5962011024232
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