HERMETICALLY SEALED AND MONOLITHIC AND POSITIVE OUTPUTS AND W/ENABLE AND W/CLEAR AND LOW POWER AND SCHOTTKY AND W/BUFFERED OUTPUT AND EDGE TRIGGERED
CQSJ
INCLOSURE MATERIAL
CERAMIC AND GLASS
CQSZ
INCLOSURE CONFIGURATION
DUAL-IN-LINE
CQWX
OUTPUT LOGIC FORM
TRANSISTOR-TRANSISTOR LOGIC
CQZP
INPUT CIRCUIT PATTERN
10 INPUT
CSSL
DESIGN FUNCTION AND QUANTITY
8 FLIP-FLOP,D-TYPE,CLOCKED
CZEQ
TIME RATING PER CHACTERISTIC
27.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,LOW TO HIGH LEVEL OUTPUT AND 27.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,HIGH TO LOW LEVEL OUTPUT
TEST
TEST DATA DOCUMENT
96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS,INDIVIDUAL MANUFACTUREER STANDARDS,ETC.).
Components Related to NSN - 5962-01-068-9595, 5962010689595
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