HERMETICALLY SEALED AND MONOLITHIC AND POSITIVE OUTPUTS AND SCHOTTKY AND W/CLEAR AND COMPLEMENTARY OUTPUTS AND EDGE TRIGGERED
CQSJ
INCLOSURE MATERIAL
CERAMIC AND GLASS
CQSZ
INCLOSURE CONFIGURATION
DUAL-IN-LINE
CQWX
OUTPUT LOGIC FORM
TRANSISTOR-TRANSISTOR LOGIC
CQZP
INPUT CIRCUIT PATTERN
6 INPUT
CSSL
DESIGN FUNCTION AND QUANTITY
4 FLIP-FLOP,D-TYPE,CLOCKED
CZEQ
TIME RATING PER CHACTERISTIC
2.00 NANOSECONDS MINIMUM PROPAGATION DELAY TIME,LOW TO HIGH LEVEL OUTPUT AND 20.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,LOW TO HIGH LEVEL OUTPUT
TEST
TEST DATA DOCUMENT
81349-MIL-STD-883 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS,BROCHURES,ETC.,THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS,INDUSTRY DIRECTORIES,AND SIMILAR TRADE PUBLICATIONS,REFLECTI
Components Related to NSN - 5962-01-010-7812, 5962010107812
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