MONOLITHIC AND HERMETICALLY SEALED AND HIGH SPEED AND LOW POWER AND NEGATIVE OUTPUTS
CQSJ
INCLOSURE MATERIAL
CERAMIC AND GLASS
CQSZ
INCLOSURE CONFIGURATION
DUAL-IN-LINE
CQWX
OUTPUT LOGIC FORM
TRANSISTOR-TRANSISTOR LOGIC
CQZP
INPUT CIRCUIT PATTERN
DUAL 4 INPUT
CSSL
DESIGN FUNCTION AND QUANTITY
2 GATE,NAND
CTFT
CASE OUTLINE SOURCE AND DESIGNATOR
T0-116 JOINT ELECTRON DEVICE ENGINEERING COUNCIL
CZEQ
TIME RATING PER CHACTERISTIC
22.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,LOW TO HIGH LEVEL OUTPUT AND 15.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,HIGH TO LOW LEVEL OUTPUT
TEST
TEST DATA DOCUMENT
96906-MIL-STD-883B STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS,INDIVIDUAL MANUFACTUREER STANDARDS,ETC.).
Components Related to NSN - 5962-00-160-5015, 5962001605015
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