| Item Name | Semiconductor Device Diode |
| Federal Supply Group (FSG) | Electrical and Electronic Equipment Components |
| Federal Supply Class (FSC) | 5961 Semiconductor Devices and Associated Hardware |
| National Item Identification Number (NIIN) | 00-492-7626 (004927626) |
| NCB Code | USA (00) |
| Manufacturer | Rockwell Collins Aerospace, Diodes Inc, General Semiconductor Inc, Lacon Electronic Gmbh, Adelco Elektronik Gmbh, Freescale Semiconductor Inc, Infineon Technologies, Microsemi Corporation |
| Part Number | Manufacturer | Item Name | Cage Code | RFQ |
|---|---|---|---|---|
| 353-1152-001 | rockwell collins aerospace | semiconductor device diode | 95105 | RFQ |
| JAN1N2976B | diodes inc | semiconductor device diode | 51182 | RFQ |
| JAN1N2976B | general semiconductor inc | semiconductor device diode | 24444 | RFQ |
| JAN1N2976B | lacon electronic gmbh | semiconductor device diode | d6528 | RFQ |
| JAN1N2976B | adelco elektronik gmbh | semiconductor device diode | c7191 | RFQ |
| JAN1N2976B | freescale semiconductor inc | semiconductor device diode | 04713 | RFQ |
| JAN1N2976B | infineon technologies | semiconductor device diode | 81483 | RFQ |
| JAN1N2976B | microsemi corporation | semiconductor device diode | 12954 | RFQ |
| JAN1N2976BA | adelco elektronik gmbh | semiconductor device diode | c7191 | RFQ |
| MRC | Criteria | Characteristic |
|---|---|---|
| ABHP | OVERALL LENGTH | 0.450 INCHES MAXIMUM |
| ADAV | OVERALL DIAMETER | 0.437 INCHES MAXIMUM |
| AKPV | MOUNTING FACILITY QUANTITY | 1 |
| AXGY | MOUNTING METHOD | THREADED STUD |
| CBBL | FEATURES PROVIDED | HERMETICALLY SEALED CASE |
| CCDG | OVERALL WIDTH ACROSS FLATS | 0.424 INCHES MAXIMUM |
| CQJX | NOMINAL THREAD SIZE | 0.190 INCHES |
| CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 12.0 MAXIMUM NOMINAL REGULATOR VOLTAGE |
| CTQX | CURRENT RATING PER CHARACTERISTIC | 210.00 MILLIAMPERES MAXIMUM MAXIMUM REVERSE SURGE CURRENT |
| CTRD | POWER RATING PER CHARACTERISTIC | 10.0 WATTS MAXIMUM TOTAL POWER DISSIPATION |
| CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 150.0 DEG CELSIUS JUNCTION |
| MATT | MATERIAL | SILICON SEMICONDUCTOR |
| TEST | TEST DATA DOCUMENT | 13499-353-1152 DRAWING (THIS IS THE BASIC GOVERNING DRAWING,SUCH AS A CONTRACTOR DRAWING,ORIGINAL EQUIPMENT MANUFACTURER DRAWING,ETC.; EXCLUDES ANY SPECIFICATION,STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRA |
| THSD | THREAD SERIES DESIGNATOR | UNF |
| TTQY | TERMINAL TYPE AND QUANTITY | 2 TAB,SOLDER LUG |
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| 5962-01-468-3171 (5962014683171) | 5930-01-462-7010 (5930014627010) | 5975-01-213-2865 (5975012132865) | 5998-01-663-9810 (5998016639810) | |
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