| Item Name | Semiconductor Device Diode |
| Federal Supply Group (FSG) | Electrical and Electronic Equipment Components |
| Federal Supply Class (FSC) | 5961 Semiconductor Devices and Associated Hardware |
| National Item Identification Number (NIIN) | 00-412-0871 (004120871) |
| NCB Code | USA (00) |
| Manufacturer | Fairchild Semiconductor Corp, Raytheon Company, Gilbert Engineering Co Inc |
| Part Number | Manufacturer | Item Name | Cage Code | RFQ |
|---|---|---|---|---|
| 1N5282 | fairchild semiconductor corp | semiconductor device diode | 07263 | RFQ |
| 720609-1 | raytheon company | semiconductor device diode | 05869 | RFQ |
| FDH6097 | fairchild semiconductor corp | semiconductor device diode | 07263 | RFQ |
| SG9066 | gilbert engineering co inc | semiconductor device diode | 03877 | RFQ |
| MRC | Criteria | Characteristic |
|---|---|---|
| ABHP | UNABLE TO DECODE | UNABLE TO DECODE |
| ABJT | UNABLE TO DECODE | UNABLE TO DECODE |
| ADAV | UNABLE TO DECODE | UNABLE TO DECODE |
| AXGY | UNABLE TO DECODE | UNABLE TO DECODE |
| CBBL | UNABLE TO DECODE | UNABLE TO DECODE |
| CTQN | UNABLE TO DECODE | UNABLE TO DECODE |
| CTQX | UNABLE TO DECODE | UNABLE TO DECODE |
| CTSG | UNABLE TO DECODE | UNABLE TO DECODE |
| MATT | UNABLE TO DECODE | UNABLE TO DECODE |
| TEST | UNABLE TO DECODE | UNABLE TO DECODE |
| TTQY | UNABLE TO DECODE | UNABLE TO DECODE |
| Components Related to NSN - 5961-00-412-0871, 5961004120871 | ||||
| 5935-01-376-7509 (5935013767509) | 5965-01-666-8488 (5965016668488) | 5935-01-555-5092 (5935015555092) | 5975-01-685-8352 (5975016858352) | |
| 5998-01-392-3340 (5998013923340) | 5935-01-455-0919 (5935014550919) | 5935-01-087-5784 (5935010875784) | 5930-00-968-5115 (5930009685115) | |
| 5998-01-276-6482 (5998012766482) | 5962-01-169-3639 (5962011693639) | 5985-00-717-2726 (5985007172726) | 5935-01-353-1203 (5935013531203) | |
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