| Item Name | Semiconductor Device Diode |
| Federal Supply Group (FSG) | Electrical and Electronic Equipment Components |
| Federal Supply Class (FSC) | 5961 Semiconductor Devices and Associated Hardware |
| National Item Identification Number (NIIN) | 00-412-0871 (004120871) |
| NCB Code | USA (00) |
| Manufacturer | Fairchild Semiconductor Corp, Raytheon Company, Gilbert Engineering Co Inc |
| Part Number | Manufacturer | Item Name | Cage Code | RFQ |
|---|---|---|---|---|
| 1N5282 | fairchild semiconductor corp | semiconductor device diode | 07263 | RFQ |
| 720609-1 | raytheon company | semiconductor device diode | 05869 | RFQ |
| FDH6097 | fairchild semiconductor corp | semiconductor device diode | 07263 | RFQ |
| SG9066 | gilbert engineering co inc | semiconductor device diode | 03877 | RFQ |
| MRC | Criteria | Characteristic |
|---|---|---|
| ABHP | UNABLE TO DECODE | UNABLE TO DECODE |
| ABJT | UNABLE TO DECODE | UNABLE TO DECODE |
| ADAV | UNABLE TO DECODE | UNABLE TO DECODE |
| AXGY | UNABLE TO DECODE | UNABLE TO DECODE |
| CBBL | UNABLE TO DECODE | UNABLE TO DECODE |
| CTQN | UNABLE TO DECODE | UNABLE TO DECODE |
| CTQX | UNABLE TO DECODE | UNABLE TO DECODE |
| CTSG | UNABLE TO DECODE | UNABLE TO DECODE |
| MATT | UNABLE TO DECODE | UNABLE TO DECODE |
| TEST | UNABLE TO DECODE | UNABLE TO DECODE |
| TTQY | UNABLE TO DECODE | UNABLE TO DECODE |
| Components Related to NSN - 5961-00-412-0871, 5961004120871 | ||||
| 5905-00-502-3441 (5905005023441) | 5905-00-448-5537 (5905004485537) | 5940-00-621-2008 (5940006212008) | 5930-01-327-2312 (5930013272312) | |
| 5999-00-539-5784 (5999005395784) | 5905-01-313-7171 (5905013137171) | 5950-01-076-6980 (5950010766980) | 5965-01-571-2725 (5965015712725) | |
| 5920-01-501-5961 (5920015015961) | 5930-01-296-8547 (5930012968547) | 5996-00-048-2496 (5996000482496) | 5930-00-022-4311 (5930000224311) | |
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