| Item Name | Capacitor Fixed Ceramic Dielectr |
| Federal Supply Group (FSG) | Electrical and Electronic Equipment Components |
| Federal Supply Class (FSC) | 5910 Capacitors |
| National Item Identification Number (NIIN) | 01-337-4912 (013374912) |
| NCB Code | USA (01) |
| Manufacturer | American Technical Ceramics Corp, Raytheon Company, Military Specifications, Murata Erie North America Inc |
| Part Number | Manufacturer | Item Name | Cage Code | RFQ |
|---|---|---|---|---|
| 100A150G150X | american technical ceramics corp | capacitor fixed ceramic dielectr | 29990 | RFQ |
| 536455-384 | raytheon company | capacitor fixed ceramic dielectr | 96214 | RFQ |
| CDR12BG150AGUR | military specifications | capacitor fixed ceramic dielectr | 81349 | RFQ |
| CDR12BG150AGUS | military specifications | capacitor fixed ceramic dielectr | 81349 | RFQ |
| MA18150G | murata erie north america inc | capacitor fixed ceramic dielectr | 18796 | RFQ |
| MIL-C-55681/4 | military specifications | capacitor fixed ceramic dielectr | 81349 | RFQ |
| MIL-PRF-55681/4 | military specifications | capacitor fixed ceramic dielectr | 81349 | RFQ |
| MRC | Criteria | Characteristic |
|---|---|---|
| AARH | RELIABILITY FAILURE RATE LEVEL IN PERCENT | 0.001 |
| ADAQ | BODY LENGTH | 0.030 INCHES MINIMUM AND 0.080 INCHES MAXIMUM |
| ADAU | BODY HEIGHT | 0.020 INCHES MINIMUM AND 0.057 INCHES MAXIMUM |
| ZZZK | SPECIFICATION/STANDARD DATA | 81349-MIL-C-55681/4 GOVERNMENT SPECIFICATION |
| CQBQ | CAPACITANCE VALUE PER SECTION | 15.000 PICOFARADS SINGLE SECTION |
| ABJT | TERMINAL LENGTH | 0.005 INCHES MINIMUM AND 0.020 INCHES MAXIMUM |
| ADAT | BODY WIDTH | 0.040 INCHES MINIMUM AND 0.070 INCHES MAXIMUM |
| AEBZ | SCHEMATIC DIAGRAM DESIGNATOR | NO COMMON OR GROUNDED ELECTRODE(S) |
| CQBF | INSULATION RESISTANCE AT MAXIMUM OPERATING TEMP | 100000.0 MEGOHMS |
| CRHD | TOLERANCE OF TEMP COEFFICIENT PER SECTION IN PPM PER DEG CELSIUS | -20.0/20.0 SINGLE SECTION |
| CRTP | TOLERANCE RANGE PER SECTION | -2.00 TO 2.00 PERCENT SINGLE SECTION |
| CWJK | CASE MATERIAL | CERAMIC OR GLASS |
| CWPM | DISSIPATION FACTOR AT REFERENCE TEMP IN PERCENT | 0.050 |
| CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
| AAQL | BODY STYLE | CHIP TYPE |
| AARG | RELIABILITY INDICATOR | ESTABLISHED |
| CQJJ | NONDERATED OPERATING TEMP | -55.0 DEG CELSIUS MINIMUM AND 125.0 DEG CELSIUS MAXIMUM |
| CQLZ | TEMP COEFFICIENT OF CAPACITANCE PER SECTION IN PPM PER DEG CELSIUS | 90.0 SINGLE SECTION |
| CQWM | NONDERATED CONTINUOUS VOLTAGE RATING AND TYPE PER SECTION | 50.0 DC SINGLE SECTION |
| CWPK | INSULATION RESISTANCE AT REFERENCE TEMP | 1000000.0 MEGOHMS |
| TEST | TEST DATA DOCUMENT | 81349-MIL-C-55681 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS,BROCHURES,ETC.,THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS,INDUSTRY DIRECTORIES,AND SIMILAR TRADE PUBLICATIONS,REFLECTI |
| TTQY | TERMINAL TYPE AND QUANTITY | 2 BONDING PAD |
| Components Related to NSN - 5910-01-337-4912, 5910013374912 | ||||
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| 5970-01-146-4146 (5970011464146) | 5975-01-393-2233 (5975013932233) | 5999-01-420-7755 (5999014207755) | 5910-00-826-2725 (5910008262725) | |
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